Wafer testing is carried out during the manufacture of semi-conductor components to prevent defective circuits. The F46 capacitive sensor features a flat design and is not affected by the wafer’s color, enabling reliable detection of wafers along the testing line.
Industry leaders offer insights into how they’re dealing with Trump’s shifting tariffs and explain the effects on specific technologies, supply chains and pricing strategies.
The focus of this acquisition is on the development of AI, digital twins and supply chain and manufacturing software platforms for the discrete manufacturing industries.
Get insights on the issues associated with integrating edge computing into a legacy manufacturing environment, as well as how edge computing aids predictive maintenance, manufacturing operations resiliency and cybersecurity.
