SIS I/O Boosts Speed, Accuracy

Feb. 14, 2007
A new generation of I/O subsystems for the vendor’s flagship Tricon triple-modular-redundant safety instrumented systems (SIS) offers multiple improvements.
These include higher point density, higher resolution, faster scan rates, an innovative approach for per-point supervision, and user-configurable nominal load limits in the digital output modules, says the vendor. These new features are designed to provide increased speed and better accuracy in high-speed critical control applications, while decreasing the cost per I/O point and cost of ownership. The new high-density I/O modules have achieved TÜV certification for European Union ATEX standards covering I/O and field terminations in potentially explosive atmospheres.



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