For solar wafer cell production, the NIR camera measures electroluminescence (EL) and allows for the detection of fractures as well as failures in the above mentioned crystal structure. The images provide information on the integrity and effectiveness of each wafer prior to the next processing step. Other features of the NIR camera include high-sensitivity at required wavelengths and high-resolution images at 1392 x 1040 pixels. Baumer Groupwww.baumer.com