It can be configured to work with many older finite conjugate
microscope systems as well as individual telecentric optics. The
FocusTrac design is based upon a modified optical version of the “mean
transfer function” commonly used in CD/DVD players. By applying
advanced optics, mechanics and electronics, the FocusTrac is designed
to differentiate between “in-focus,” “above focus” and “below focus”
conditions to produce a relative error signal that can be used to drive
the position of the microscope and objectives relative to the sample of
interest into an “in focus” condition. Use of the FocusTrac can produce
a substantial increase in throughput and reduced processing time for an
automated or manual inspection system, says the vendor. Applications
include semiconductor wafers and devices, hard-disk read/write heads
and disks, razor blades, photovoltaic substrates, MEMs devices, flat
panel displays and other inspection and vision-based applications. Motion X Corp.www.motionx.org805.968.2001
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