The Cybersecurity Pros and Cons of Smart Instruments: Part 2
In this episode (Part 2 of 2), we connect with Nathan Hedrick and Ryan Williams of Endress + Hauser to understand how to approach smart instrument cybersecurity from holistic and device-specific points of view.
David Greenfield joined Automation World in June 2011. Bringing a wealth of industry knowledge and media experience to his position, David’s contributions can be found in AW’s print and online editions and custom projects. Earlier in his career, David was Editorial Director of Design News at UBM Electronics, and prior to joining UBM, he was Editorial Director of Control Engineering at Reed Business Information, where he also worked on Manufacturing Business Technology as Publisher.
