The SNAP-AIRATE-HFi rate input and SNAP-AOD-29-HFi pulse-width modulation (PWM) output modules support testing, simulation, and other high-speed applications.
The modules are intended for test engineers, technicians, and others working with high-speed machinery, equipment test beds, and other applications that monitor high-frequency analog signals and rapidly switch digital outputs in response to a changing analog value. Both modules are used with the company's SNAP PAC System, which includes programmable automation controllers (PACs) and Ethernet-based I/O systems. The rate input module connects to TTL, CMOS, and open-collector outputs, and is typically used for high-speed (up to 500 kHz) pulse scanning. It has two isolated channels, each of which can be configured for a 0.1-s measurement interval with an input range of 20 Hz to 500 kHz, or a 1-s measurement interval with an input range of 2 Hz to 500 kHz. For each channel. Internal 9 VDC power is provided for devices with open-collector outputs, making it unnecessary to provide a pull-up voltage supply. The output module sends PWM outputs to high-frequency transducers and can be used, for example, with test bed applications that simulate tachometer outputs. Each of the module's two optically isolated channels can switch 100 mA of load current ranging from 2.5 VDC to 24 VDC (supplied externally), over a period range of 10 µs to 64.25 s (0-100 kHz).
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